APPLIED NANOSTRUCTURES, INC.
MOUNTAIN VIEW, CA 94043-2230
Visibility Score
28
Capabilities Narrative
Manufacturer of probes and accessories for Scanning Probe Microscopes
NAICS Codes
| Code | Description | Primary |
|---|---|---|
| 334413.0 | Semiconductor and Related Device Manufacturing |
Keywords
SPM PROBE TIPS, AFM PROBES, TERS PROBES, MFM PROBES, MEMS NANOSTRUCTURES, Scanning Thermal Microscopy (SThM) Module, Step Height Standards
Contact Information
Business Details
- UEI
- T8TPBYQ862F9
- CAGE Code
- 47Y49
- Year Established
- 2004
- Legal Structure
- Subchapter S Corporation
- Congressional District
- 16.0