ADVANCED SURFACE PROCESSES, LLC
EDGEWOOD, NM 87015-8019
WOSB Certified
Visibility Score
56
Capabilities Narrative
Scanning electron microscope (SEM) imaging capable of resolving and measuring features down to 3nm in high vacuum, 4nm in low vacuum. We can accommodate samples up to 2 inches cubed, both conductive and non-conductive, and up to 2lb in weight. Images can be obtained from multiple viewing angles, ...
NAICS Codes
| Code | Description | Primary |
|---|---|---|
| 541380 | Testing Laboratories and Services | |
| 541990 | All Other Professional, Scientific and Technical Services |
Keywords
Microscopy, scanning electron microscope, SEM, sample preparation, cross sectioning, ion polishing, materials, analysis, energy dispersive x-ray spectroscopy, EDS, EDX, gold sputtering, carbon sputtering, failure analysis, surface analysis, metrology, rapid, expedited
Contact Information
Business Details
- UEI
- S1NRSLTR1EE3
- CAGE Code
- 9U8V0
- Year Established
- 2023
- Legal Structure
- Corporation
- Congressional District
- 01